ECE216
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ECE 216 - Defects in Semiconductors
Full Course Title
Defects in Semiconductors
Instructor Name(s)
STAFF
Course Description
Structural and electronic properties of elementar defects in semiconductors. Point defects and impurity complexes. Deep levels. Dislocations and grain boundary electronic properties. Measurement techniques for radiative and nonradiative defect centers.
Unit Value
3
Maximum number of times course can be repeated for additional credit
99
Maximum Units
99
Prerequisites
Advisory Enrollment Comments
Same course as Materials 216.